The gap between lab measurements and real-world applications can lead to suboptimal socket selection and hidden quality risks for customers.
As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater.
Traditional socket design validation methods, such as per-pin characterization and generic housing evaluations, often fall short of reflecting true application-specific system-level performance.
Most socket manufacturers use these methods to measure the performance of new sockets, which can limit socket performance insight and lead to suboptimal socket selection and hidden quality risks for customers.
The gap between lab measurements and real-world application not only limits socket performance insight but can also lead to suboptimal socket selection and hidden quality risks for customers.
Author summary: Enhancing test socket performance is crucial for reliable applications.